Objective
Fundamental Principles of SAXS:
SAXS makes the use of x-ray scattering toward low angle (typically less than 10 degree). Since this angular range contains information about sample's inhomogeneities (i.e., electron density difference) in size ranging from ~5 to ~150 nm, SAXS can provide structural information (i.e., size, size distribution and shape) of macromolecules of repeat distances in partially ordered systems up to ~150 nm whose dimensions are on the same order as the X-ray wavelength.
SAXS makes the use of x-ray scattering toward low angle (typically less than 10 degree). Since this angular range contains information about sample's inhomogeneities (i.e., electron density difference) in size ranging from ~5 to ~150 nm, SAXS can provide structural information (i.e., size, size distribution and shape) of macromolecules of repeat distances in partially ordered systems up to ~150 nm whose dimensions are on the same order as the X-ray wavelength.
Equipment & Details
Small Angle X-Ray Scattering (SAXS)
Manufacturer : XENOCS S.A. France, Xenocs SAS - Headquarters
38360 Sassenage, France
Instrument Details :
X-ray Source: 30 Watts Cu tube with 50 KV 0.6mA current
Optics: Single reflection multilayer parabolic mirror.
Slits : Single crystal scatter less slits ( S1, S2)
Detector: Single photon counting Hybrid pixel on-line
detector Pilatus 300K from Dectries.
Automation: SpecFE based software to control motors slits, etc.
Data Acquisition: Foxtrot
Analysis Software: Sasfit from Synchtron Granobel.
Purchase source: H P I Services, India
Year of installation: 2015
Sample Details
The samples can be solid or liquid and they can contain solid, liquid or
gaseous domains (so-called particles) of the same or another material.
The applications include a wide variety of samples such as colloids,
metal particles, ceramic particles, polymers, proteins and
pharmaceuticals in the form of power, gel, thin film, solution, etc.
Utility and Working Principle
It works on the principle of Braggs Law.
nλ=2d sinθ, where:
- λisthe wavelength of the x-ray,
- disthe spacing of the crystal layers (path difference),
- θis the incident angle (the angle between incident ray and the scatter plane), and
- nisan integer