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Objective
Scanning Electron Microscope examines the microstructure images and composition analysis (EDS) of surfaces and interphase interfaces of small and of dry specimens.
Equipment & Details
Analytical Scanning Electron Microscope (A-SEM).
ZEISS EVO 60 Scanning Electron Microscope with Oxford EDS Detector. The Microscope works with tungsten filament and maximum acceleration voltage of 30 kV.Facilities:
(1) Secondary Electron Detector (SE),
(2)Backscattered Electron Detector (BSD)
(3) Energy Dispersive X-ray Spectroscopy (EDS): for
•Qualitative Microanalysis,
•Quantitative Microanalysis,
•X-ray Area Mapping,
•Line Scanning
(4) Wavelength Dispersive X-ray Spectroscopy (WDS): for
•Qualitative Microanalysis,
•Quantitative Microanalysis
(5) Electron Backscattered Diffraction (EBSD)
(6) Variable Pressure Secondary Electron (VPSE) mode
Manufacturer's details:
SEM: Carl ZEISS SMT, Germany
EDS & WDX: INCA PentaFET x3, Oxford Instrument UK.
EBSD : Nordlys HKL Technology, UK
Sputter coater: POLARON, UK
Purchase source (funding): MHRD
Year of installation: Sept 2008
Sample Details
The samples should be clean, dry, small piece of solid or powder.